Logo image
Back
Surface topography and surface chemistry of radiation-patterned P(tBuMA) - Analysis by atomic force microscopy
Journal article   Peer reviewed

Surface topography and surface chemistry of radiation-patterned P(tBuMA) - Analysis by atomic force microscopy

Gregory S Watson, Jolanta A Blach, D V Nicolau, D K Pham, J Wright and S Myhra
Polymer International, Vol.52(9), pp.1408-1414
2003
DOI: https://doi.org/10.1002/pi.1113
url
https://doi.org/10.1002/pi.1113View
Published Version

Abstract

poly-tert-butylmethacrylate surface topography surface chemistry radiation patterning atomic force microscopy
Poly-(tert-butyl methacrylate) (P(tBuMA)) thin-film surfaces were patterned by UV radiation at doses in the range 10-100mJ cm-2, in order to induce laterally differentiated surface chemistry with μm resolution. The most likely pathway for the radiation chemistry predicts a transition from hydrophobicity to hydrophilicity. Outcomes of analysis by atomic force microscopy under air ambient conditions were consistent with that prediction. Topographic and lateral force imaging, in combination with friction loop analysis, revealed shrinkage and increased friction arising from exposure. Force versus distance analysis revealed greater adhesion in hydrophilic regions, due to greater meniscus force acting on the tip. The thickness of adsorbed moisture, increased by a factor of 2.5 from ca 0.8 nm for the unirradiated surface, as a result of greater hydrophilicity induced by radiation. The latter observation shows that the increased friction was due principally to the greater normal force on the tip from an additional meniscus force. © 2003 Society of Chemical Industry.

Details

Metrics

592 Record Views
4 Times Cited - Web of Science

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Collaboration types
Domestic collaboration
Web Of Science research areas
Polymer Science
Logo image