Sign in
Scanning Kelvin Probe Force Microscopy as a means for comparative quantification of cold-rolling and visualizing the surface susceptibility to galvanic cells; compared to neutron diffraction and EBSD
Journal article   Peer reviewed

Scanning Kelvin Probe Force Microscopy as a means for comparative quantification of cold-rolling and visualizing the surface susceptibility to galvanic cells; compared to neutron diffraction and EBSD

Madjid Sarvghad, Theodore A. Steinberg and Geoffrey Will
Progress in Surface Science, Vol.95(3), pp.1-11
2020
url
https://doi.org/10.1016/j.progsurf.2020.100594View
Published Version

Abstract

atomic force microscopy (AFM) Kelvin probe microscopy neutron diffraction electron backscatter diffraction (EBSD) lattice defects Volta potential

Details

Metrics

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Web Of Science research areas
Chemistry, Physical
Physics, Condensed Matter

UN Sustainable Development Goals (SDGs)

This output has contributed to the advancement of the following goals:

undefined

Source: InCites