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Measuring retention of chromated copper arsenate in conifer sapwood by direct-scan x-ray techniques
Journal article   Peer reviewed

Measuring retention of chromated copper arsenate in conifer sapwood by direct-scan x-ray techniques

Susan M Smith, Jeffrey J Morrell and Jerrold E Winandy
Journal of Wood Chemistry and Technology, Vol.10(1), pp.21-38
1990
DOI: https://doi.org/10.1080/02773819008050225
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https://doi.org/10.1080/02773819008050225View
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Abstract

nondestructive examination wood preservation chromated copper arsenate conifer sapwood inorganic arsenicals preservative retention wood
This study was designed to indicate how well direct-scan X-raying predicts preservative retention and distribution of chromated copper arsenate (CCA) in wafers of conifer sapwood. The intensity of X-rays passed through western hemlock wafers treated with varying concentrations of CCA solutions was inversely proportional to preservative concentration. X-ray intensities predicted 98% of the variation in preservative retention among the wafers. Intensity of direct-scan X-rays passed through selected test materials was consistent over a 9-month span. X-ray intensity over 1000 readings at a single scan point had a coefficient of variation of 0.1%. The strong relationship between direct-scan X-ray intensity and preservative retention, as well as the repeatability of intensity readings over time and the small variation in intensity readings at each data point, indicate that direct-scan X-ray techniques can be used to assess preservative retention and distribution in wood treated with inorganic arsenicals such as CCA.

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Domestic collaboration
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Materials Science, Paper & Wood
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