In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces

Roland De Marco; Z T Jiang; B Pejcic; A van Riessen

doi:10.1016/j.electacta.2006.01.034

$In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces$

Journal article

Peer reviewed

In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces

Roland De Marco, Z T Jiang, B Pejcic and A van Riessen

Electrochimica Acta, Vol.51(23), pp.4886-4891

2006

DOI: https://doi.org/10.1016/j.electacta.2006.01.034

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Abstract

Physical Chemistry (incl. Structural)

ion-selective electrode

chalcogenide glass

electrode dynamics

atomic force

An in situ surface study of the iron chalcogenide glass membrane ion-selective electrode (ISE) in aqueous media has been undertaken using a tandem technique of mixed potential/synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) and atomic force microscopy (AFM). This work has simultaneously monitored the mixed potential and in situ surface diffraction patterns of this crystalline glassy material, showing that the observed gradual shift of the electrode potential in the anodic direction is linked to the preferential dissolution of the GeSe (1 1 1), GeSe (1 0 1) and GeSe (1 4 1) and/or Sb2Se3 (0 1 3), Sb2Se3 (2 2 1) and Sb2Se3 (0 2 0) surfaces. Expectedly, these observations are internally consistent with preferential oxidative attack of the crystalline regions of the membrane comprising GeSe and/or Sb2Se3, as evidenced by AFM imaging of the electrode surface. Clearly, this work corroborates the results of previous ex situ surface studies on the iron chalcogenide glass ISE, whereby it was shown that alkaline saline solutions have a tendency to alter the surface chemistry and concomitant response characteristics of the ISE.

Details

Title: In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces
Authors: Roland De Marco (Author) - Curtin University of Technology
Z T Jiang (Author) - Curtin University of Technology
B Pejcic (Author) - Curtin University of Technology
A van Riessen (Author) - Curtin University of Technology
Publication details: Electrochimica Acta, Vol.51(23), pp.4886-4891
Publisher: Pergamon
Date published: 2006
DOI: 10.1016/j.electacta.2006.01.034
ISSN: 0013-4686
Organisation Unit: University of the Sunshine Coast, Queensland; Office of the Deputy Vice-Chancellor (Research and Innovation)
Language: English
Record Identifier: 99450155802621
Output Type: Journal article

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