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In situ structural characterization of electrochemical systems using synchrotron-radiation techniques
Journal article   Peer reviewed

In situ structural characterization of electrochemical systems using synchrotron-radiation techniques

Roland De Marco and J P Veder
Trends in Analytical Chemistry, Vol.29(6), pp.528-537
2010
url
https://doi.org/10.1016/j.trac.2010.01.011View
Published Version

Abstract

electrochemistry fourier transform-infrared microspectroscopy infrared spectroscopy small-angle X-ray scattering soft X-ray microscopy synchrotron radiation X-ray absorption spectroscopy X-ray analysis

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Chemistry, Analytical

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#7 Affordable and Clean Energy

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