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Determination of the spring constants of probes for force microscopy/spectroscopy
Journal article   Peer reviewed

Determination of the spring constants of probes for force microscopy/spectroscopy

C T Gibson, Gregory S Watson and S Myhra
Nanotechnology, Vol.7(3), pp.259-262
1996
url
https://doi.org/10.1088/0957-4484/7/3/014View
Published Version

Abstract

force spectroscopy spring constants atomic force microscopy calibration spectroscopic analysis probes
A direct, accurate and convenient procedure for calibrating the spring constants of probes used for force microscopy/spectroscopy is described. It amounts to deflecting an 'unknown' cantilever with a 'standard' lever, where the standard lever has been precalibrated. The absolute and relative accuracies of the procedure are ±20-30% and ±10-20%, respectively; the former is limited by uncertainties in the determination of the spring constant for the 'standard' lever, as well as that for the 'unknown'. The method differs from others of the static deflection variety by its exploitation of the routine features of current instruments. The technique is compared with other static and dynamic methods currently being used.

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Web Of Science research areas
Materials Science, Multidisciplinary
Nanoscience & Nanotechnology
Physics, Applied
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