Logo image
Berger check prediction for concurrent error detection in the Braun array multiplier
Journal article   Peer reviewed

Berger check prediction for concurrent error detection in the Braun array multiplier

Christian M Jones, S S Dlay and R G Naguib
Microelectronics Journal, Vol.27(8), pp.745-755
1996
url
https://doi.org/10.1016/0026-2692(96)00013-4View
Published Version

Abstract

Electrical and Electronic Engineering Berger Check Symbol Prediction fault diagnosis Braun array multiplier
The design and development of concurrent error detection arithmetic and logic units has initiated significant research concerning information coding schemes. Published research has used the unidirectional fault detection capabilities of Berger codes to achieve a fault tolerant Braun array multiplier. In this paper we develop Berger check symbol prediction and show that the previously reported Berger coded prediction is in error, making the results inappropriate for the realization of practical concurrent error detection systems. Furthermore, we show that the Berger coded Braun array multiplier can not only achieve the objective for detecting unidirectional faults but analysis has indicated an inherent ability of the Berger check prediction technique for error detection beyond the scope for which it was originally intended. In fact the coding provides error detectability for single and multiple stuck-at faults. Further study suggests the performance of the Berger check prediction Braun array multiplier tends towards 100% error detectability for increasing input bit length and hence array dimensions. The Berger check predictive Braun array multiplier has, therefore, introduced a high level of concurrent error detectability with only a minimal extension in the hardware implementation.

Details

Metrics

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Web Of Science research areas
Engineering, Electrical & Electronic
Nanoscience & Nanotechnology
Logo image