Journal article
Analysis of nitrogen implanted tin oxide films used in dye-sensitised solar cells
Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol.217(1), pp.97-103
2004
Abstract
We have investigated the distribution and amount of nitrogen implanted in tin oxide films using SIMS and XPS depth profiling. The amount of nitrogen was found to increase with increasing ion dose and energy. In the nitrogen depth profile a peak was observed indicating the position of the maximum nitrogen concentration and the result was verified using theoretical calculations. The relative distribution of nitrogen compared to tin was found to decrease continuously with increasing depth of the film.
Details
- Title
- Analysis of nitrogen implanted tin oxide films used in dye-sensitised solar cells
- Authors
- Tuquabo Tesfamichael (Corresponding Author) - Queensland University of TechnologyGeoffrey Will (Author) - Queensland University of TechnologyIan Kelly (Author) - Australian Nuclear Science and Technology OrganisationJohn Bell (Author) - Queensland University of Technology
- Publication details
- Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, Vol.217(1), pp.97-103
- Publisher
- Elsevier BV
- DOI
- 10.1016/j.nimb.2003.09.021
- ISSN
- 1872-9584
- Organisation Unit
- School of Science, Technology and Engineering
- Language
- English
- Record Identifier
- 99737993802621
- Output Type
- Journal article
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- Collaboration types
- Domestic collaboration
- Web Of Science research areas
- Instruments & Instrumentation
- Nuclear Science & Technology
- Physics, Atomic, Molecular & Chemical
- Physics, Nuclear
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Source: InCites