Logo image
A near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode
Journal article   Open access   Peer reviewed

A near edge X-ray absorption fine structure (NEXAFS) study of the response mechanism of the iron (III) chalcogenide glass membrane ion-selective electrode

Mark Maric, Manzar Sohail and Roland De Marco
Electrochemistry Communications, Vol.41, pp.27-30
2014
pdf
PDF - Author's Accepted Version (Open Access)426.85 kBDownloadView
Accepted VersionCC BY-NC-ND V4.0 Open Access
url
https://doi.org/10.1016/j.elecom.2014.01.017View
Published Version

Abstract

XPS NEXAFS iron(III) ISE chalcogenide glass membrane electrode mechanism
We have utilized synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) to demonstrate unequivocally that the modified surface layer (MSL) of the iron chalcogenide glass ion-selective electrode (ISE) comprises a mixture of iron(II) and iron(III) redox states, as proposed in previous theories to explain the mixed electron transfer and ion exchange response mechanism of this analytically important ISE.

Details

Metrics

1057 File views/ downloads
2104 Record Views

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Collaboration types
Domestic collaboration
Web Of Science research areas
Electrochemistry
Logo image