Conference paper
Polymeric surface alteration via scanning probe microscopy
Proceedings of the 2006 International Conference on Nanoscience and Nanotechnology, pp.592-595
International Conference on Nanoscience and Nanotechnology (ICONN), 2006 (Brisbane, Australia, 03-Jul-2006–07-Jul-2006)
IEEE (Institute of Electrical and Electronics Engineers)
2006
Abstract
This preliminary study focuses on the physical alteration/manipulation of three polymer surfaces (Polyimide, PDMS and P(tBuMA)), via the Scanning Probe Microscope (SPM). The aim of this study is to investigate the degree of surface manipulation (lithographic outcomes) on the different polymer surfaces under similar raster scanning loading conditions. The polymeric materials were selected based on their varying degree of 'stiffness' (i.e., Young's modulus), commercial availability, potential applications. A clean incompressible silicon surface was used for calibration purposes. Manipulation (particularly on the softer polymer surfaces, PDMS and P(tBuMA)) was achieved using stiff levers (i.e., > 4 nNnm-1). The resultant alteration was then analyzed using a soft lever (< 0.1 nNnm-1) to avoid further manipulation and alteration. Lithographic outcomes on a surface are not only dependant on the instrumental parameters (e.g., loading force, orientation and scan speed), but they also depend on the different Young's modulus values of the polymer. It has been demonstrated that at high Young's modulus values (> 5 GPa) no discernable lithographic outcomes have been achieved. At Young's modulus values in the low GPa range (< 2 Gpa), wells, pits and orthogonal grids have be formed. On the other hand, softer polymer surfaces (Young's modulus in the kPa range) induced a stick-slip phenomena. The stick-slip behaviour was observed in both the slow and fast direction of tip travel and was monitored during the manipulation process via friction loop analysis. After the manipulation process, the area was re-scanned using a soft lever revealing uniformly formed parallel channels. Friction loop analysis revealed a progression of the formation of the stick-slip mechanism in the fast scan direction with the lateral forces gradually increasing as the number of traverses increased. The stick-slip features then begin forming and progressing until the characteristic stick-slip features are observed. Just prior to the probe slipping in the slow scan direction, the stick-slip features in the fast scan direction break down completely. The tip then slips and assumes its next equilibrium position, repeating the cycle. Lateral force data obtained on all three polymer surfaces and a calibration silicon surface showed the extent of in-plane deformation and frictional variation. The in-plane displacement (i.e., the vertical slope of the friction loop) was found to increase with a decrease in Young's modulus value which coincides with greater tip trapping, polymer deformation and relaxation. By gradually increasing the loading force, the general trend of the lateral force was observed and plotted. The results are shown in figure 1 below. The lateral force increases linearly with an increase in loading force. As expected, the polyimide and silicon surfaces are comparable due to their Young's modulus values being > ca. 5 GPa. The P( tBuMA) surface shows a greater increase with the PDMS sample showing the most dramatic increase. The three different linear responses for the PDMS surface are shown for the start, middle and end of a stick-slip cycle, with the final breakdown being omitted. A softer surface will lead to greater tip indentation, higher contact area, and therefore a higher lateral force. At higher loading forces, these effects are amplified. (Graph Presented). © 2006 IEEE.
Details
- Title
- Polymeric surface alteration via scanning probe microscopy
- Authors
- Jolanta A Watson (Author) - Griffith UniversityC L Brown (Author) - Griffith UniversityS Myhra (Author) - Griffith UniversityGregory S Watson (Author) - Griffith University
- Contributors
- C Jagadish (Editor)
- Publication details
- Proceedings of the 2006 International Conference on Nanoscience and Nanotechnology, pp.592-595
- Conference details
- International Conference on Nanoscience and Nanotechnology (ICONN), 2006 (Brisbane, Australia, 03-Jul-2006–07-Jul-2006)
- Publisher
- IEEE (Institute of Electrical and Electronics Engineers)
- Date published
- 2006
- DOI
- 10.1109/ICONN.2006.340687
- ISBN
- 9781424404520
- Organisation Unit
- School of Science and Engineering - Legacy; University of the Sunshine Coast, Queensland; School of Science, Technology and Engineering
- Language
- English
- Record Identifier
- 99449476902621
- Output Type
- Conference paper
Metrics
549 Record Views