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Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy
Journal article   Peer reviewed

Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

Gregory S Watson, B P Dinte, Jolanta A Blach and S Myhra
Journal of Physics D: Applied Physics, Vol.35(16), pp.2066-2074
2002
url
https://doi.org/10.1088/0022-3727/35/16/324View
Published Version

Abstract

atomic force microscopy
It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude than that obtained from translation of the x-y-stage.

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Physics, Applied
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